منابع مشابه
Stability of single skyrmionic bits
The switching between topologically distinct skyrmionic and ferromagnetic states has been proposed as a bit operation for information storage. While long lifetimes of the bits are required for data storage devices, the lifetimes of skyrmions have not been addressed so far. Here we show by means of atomistic Monte Carlo simulations that the field-dependent mean lifetimes of the skyrmionic and fe...
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Variation is the deviation from intended or designed values for a structure or circuit parameter of concern. The electrical performance of microprocessors or other integrated circuits are impacted by two sources of variation. Environmental factors are those which arise during the operation of a circuit, and include variations in power supply, switching activity, and temperature of the chip or a...
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Inter-communicating devices are changing the way that services and connections are set up and established over a network. This paper introduces a new paradigm for setting up a peer connection between agents through a third party administrative agent called the connection oriented routing environment (CORE). In this new paradigm, the devices no longer follow the client/server model of communicat...
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Son V. Nguyen, T. Vo*, D. Priyadarshini, T. Haigh Jr., T. Nogami, S. Cohen1, P. Flaitz2, Y. Lin2,3, H. Shobha, A. Grill1, D. Canaperi and Roy Gordon3, IBM at Albany Nanotech and SUNY Polytechnique University*, 257 Fuller Rd, Albany, NY 12203 USA; 1IBM T.J. Watson Research Center, 1101 Kitchawan Road, Route 134, Yorktown Heights, NY 10598 USA; 2IBM Semiconductor Research and Development Center, ...
متن کاملModels of Process Variations in Device and Interconnect
Variation is the deviation from intended or designed values for a structure or circuit parameter of concern. The electrical performance of microprocessors or other integrated circuits are impacted by two sources of variation. First, environmental factors are those which arise during the operation of a circuit, and include variations in power supply, switching activity, and temperature of the ch...
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ژورنال
عنوان ژورنال: Physical Review Research
سال: 2020
ISSN: 2643-1564
DOI: 10.1103/physrevresearch.2.043312